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"Using fault model relaxation to diagnose real scan chain defects."

Yu Huang, Wu-Tung Cheng, Greg Crowell (2005)

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DOI: 10.1145/1120725.1120934

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/aspdac/HuangCC05
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/HuangCC05
Yu Huang, Wu-Tung Cheng, Greg Crowell:
Using fault model relaxation to diagnose real scan chain defects. ASP-DAC 2005: 1176-1179

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