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"Towards the logic defect diagnosis for partial-scan designs."

Shi-Yu Huang (2001)

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DOI: 10.1145/370155.370366

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Shi-Yu Huang:
Towards the logic defect diagnosis for partial-scan designs. ASP-DAC 2001: 313-318

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