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"Hot carrier aging of nano-scale devices: Characterization method, ..."

Jianfu Zhang et al. (2017)

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DOI: 10.1109/ASICON.2017.8252564

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

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Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang:
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. ASICON 2017: 670-673

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