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"A novel layout automation flow to facilitate test chip design for standard ..."

Ludan Yang et al. (2017)

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DOI: 10.1109/ASICON.2017.8252418

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

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Ludan Yang, Weiwei Pan, Zheng Shi, Yongjun Zheng:
A novel layout automation flow to facilitate test chip design for standard cell characterization. ASICON 2017: 88-91

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