"High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time ..."

Jiang-Lin Wei et al. (2019)

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DOI: 10.1109/ASICON47005.2019.8983555

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-21

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Jiang-Lin Wei, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Nene Kushita, Takahiro Arai, Lei Sha, Anna Kuwana, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato:
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm. ASICON 2019: 1-4

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