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"An enhanced built-in self-repair technique for yield and reliability ..."

Shyue-Kung Lu, Hao-Wei Lin, Masaki Hashizume (2015)

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DOI: 10.1109/ASICON.2015.7516979

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-17

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Shyue-Kung Lu, Hao-Wei Lin, Masaki Hashizume:
An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories. ASICON 2015: 1-4

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