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"Self-heating Induced Variability and Reliability in Advanced Logic Devices ..."

Xiaoyan Liu et al. (2019)

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DOI: 10.1109/ASICON47005.2019.8983608

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/asicon/LiuCCDZ19
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Xiaoyan Liu, Wangyong Chen, Linlin Cai, Gang Du, Xing Zhang:
Self-heating Induced Variability and Reliability in Advanced Logic Devices and Circuits. ASICON 2019: 1-4

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