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"Generation of low power testing based on novel SIC sequences."

Bei Cao, Zhiyuan Li, Dianzhong Wen (2015)

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DOI: 10.1109/ASICON.2015.7517200

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-17

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  dblp key:
  - conf/asicon/CaoLW15
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  - https://dblp.org/rec/conf/asicon/CaoLW15
Bei Cao, Zhiyuan Li, Dianzhong Wen:
Generation of low power testing based on novel SIC sequences. ASICON 2015: 1-4

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