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"Evaluation of Null Method for Operational Amplifier Short-Time Testing."

Riho Aoki et al. (2019)

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DOI: 10.1109/ASICON47005.2019.8983452

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-21

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  dblp key:
  - conf/asicon/AokiSIOIKSMNWKH19
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  - https://dblp.org/rec/conf/asicon/AokiSIOIKSMNWKH19
Riho Aoki, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Yuto Sasaki, Kosuke Machida, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Evaluation of Null Method for Operational Amplifier Short-Time Testing. ASICON 2019: 1-4

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