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"Path Sensitization and Sub-circuit Partition of CUT Using ..."

Jin Soo Noh, Chang Gyun Park, Kang Hyeon Rhee (2004)

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DOI: 10.1007/978-3-540-30585-9_23

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  dblp key:
  - conf/asiasim/NohPR04
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Jin Soo Noh, Chang Gyun Park, Kang Hyeon Rhee:
Path Sensitization and Sub-circuit Partition of CUT Using t-Distribution for Pseudo-exhaustive Testing. AsiaSim 2004: 205-213

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