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"Improved 3LIN Hardness via Linear Label Cover."

Prahladh Harsha et al. (2019)

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DOI: 10.4230/LIPICS.APPROX-RANDOM.2019.9

access: open

type: Conference or Workshop Paper

metadata version: 2019-09-23

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  dblp key:
  - conf/approx/HarshaKLT19
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  - https://dblp.org/rec/conf/approx/HarshaKLT19
Prahladh Harsha, Subhash Khot, Euiwoong Lee, Devanathan Thiruvenkatachari:
Improved 3LIN Hardness via Linear Label Cover. APPROX-RANDOM 2019: 9:1-9:16

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