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"A Reliable and Economical Test Method for Semiconductor Device Aging."

Xinhuan Yang et al. (2022)

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DOI: 10.1109/APCCAS55924.2022.10090262

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-22

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  dblp key:
  - conf/apccas/YangSWWWZ22
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  persistent URL:
  - https://dblp.org/rec/conf/apccas/YangSWWWZ22
Xinhuan Yang, Qianqian Sang, Chuanzheng Wang, Shuo Wang, Liang Wang, Yuanfu Zhao:
A Reliable and Economical Test Method for Semiconductor Device Aging. APCCAS 2022: 520-523

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