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"Redundant transformations for BIST testability metrics-based data path ..."

Laurence Tianruo Yang, Jon C. Muzio (2002)

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DOI: 10.1109/APCCAS.2002.1115137

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Laurence Tianruo Yang, Jon C. Muzio:
Redundant transformations for BIST testability metrics-based data path allocation. APCCAS (2) 2002: 119-123

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