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"ADC linearity test signal generation algorithm."

Satoshi Uemori et al. (2010)

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DOI: 10.1109/APCCAS.2010.5774755

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Satoshi Uemori, Takahiro J. Yamaguchi, Satoshi Ito, Yohei Tan, Haruo Kobayashi, Nobukazu Takai, Kiichi Niitsu, Nobuyoshi Ishikawa:
ADC linearity test signal generation algorithm. APCCAS 2010: 44-47

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