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"Built-in self-test/repair scheme for TSV-based three-dimensional ..."
Hung-Yen Huang, Yu-Sheng Huang, Chun-Lung Hsu (2010)
- Hung-Yen Huang, Yu-Sheng Huang, Chun-Lung Hsu:
Built-in self-test/repair scheme for TSV-based three-dimensional integrated circuits. APCCAS 2010: 56-59
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