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"Physically-based reduced-order capacity loss model: SEI layer growth and ..."

Xing Jin et al. (2017)

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DOI: 10.23919/ACC.2017.7962934

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/amcc/JinVHSSGWV17
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  - https://dblp.org/rec/conf/amcc/JinVHSSGWV17
Xing Jin, Ashish P. Vora, Vaidehi Hoshing, Tridib Saha, Gregory M. Shaver, Edwin R. García, Oleg Wasynczuk, Subbarao Varigonda:
Physically-based reduced-order capacity loss model: SEI layer growth and active material loss for graphite anode. ACC 2017: 80-85

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