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"An Image Quality Assessment Method for Surface Defect Inspection."

Hsien-I Lin, Po-Yi Lin (2020)

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DOI: 10.1109/AITEST49225.2020.00008

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/aitest/LinL20
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  - https://dblp.org/rec/conf/aitest/LinL20
Hsien-I Lin, Po-Yi Lin:
An Image Quality Assessment Method for Surface Defect Inspection. AITest 2020: 1-6

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