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"Mask Defect Detection: A Journey through Real-World Applications of ..."

Cheng-Yuan Ho, Yong-Sheng Yang (2023)

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DOI: 10.1145/3625343.3625345

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-28

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Cheng-Yuan Ho, Yong-Sheng Yang:
Mask Defect Detection: A Journey through Real-World Applications of CNN-based Models. AIMLR 2023: 2:1-2:5

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