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"Clique Algorithm to Minimize Item Exposure for Uniform Test Forms Assembly."

Takatoshi Ishii, Maomi Ueno (2015)

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DOI: 10.1007/978-3-319-19773-9_80

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  - conf/aied/IshiiU15
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Takatoshi Ishii, Maomi Ueno:
Clique Algorithm to Minimize Item Exposure for Uniform Test Forms Assembly. AIED 2015: 638-641

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