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"Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping ..."

Yu-Chieh Ting et al. (2020)

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DOI: 10.1007/978-3-030-40605-9_31

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-08

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  dblp key:
  - conf/acivs/TingLCT20
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  - https://dblp.org/rec/conf/acivs/TingLCT20
Yu-Chieh Ting, Daw-Tung Lin, Chih-Feng Chen, Bor-Chen Tsai:
Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping Defects Using Convolutional Neural Network. ACIVS 2020: 360-369

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