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"Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G ..."

Quang Huy Le et al. (2019)

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DOI: 10.1109/5GWF.2019.8911632

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Quang Huy Le, Dang Khoa Huynh, Defu Wang, Thomas Kämpfe, Zhixing Zhao, Steffen Lehmann:
Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs. 5G World Forum 2019: 7-10

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