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"3D X-ray microscopy: A near-SEM non-destructive imaging technology used in ..."

Yuri Sylvester et al. (2013)

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DOI: 10.1109/3DIC.2013.6702396

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  dblp key:
  - conf/3dic/SylvesterHJE13
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  - https://dblp.org/rec/conf/3dic/SylvesterHJE13
Yuri Sylvester, Luke Hunter, Bruce Johnson, Raleigh Estrada:
3D X-ray microscopy: A near-SEM non-destructive imaging technology used in the development of 3D IC packaging. 3DIC 2013: 1-7

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