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"Integrated circuit defect-sensitivity - theory and computational models."
José Pineda de Gyvez (1993)
- José Pineda de Gyvez:
Integrated circuit defect-sensitivity - theory and computational models. The Kluwer international series in engineering and computer science 208, Kluwer 1993, ISBN 978-0-7923-9306-1, pp. I-XXI, 1-167

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