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"Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs."

Brandon Noia, Krishnendu Chakrabarty (2014)

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DOI: 10.1007/978-3-319-02378-6

access: closed

type: Book or Thesis

metadata version: 2022-01-03

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Brandon Noia, Krishnendu Chakrabarty:
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. Springer 2014, ISBN 978-3-319-02377-9, pp. I-XVIII, 1-245

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