BibTeX record conf/itc/VrankenWFL01

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@inproceedings{DBLP:conf/itc/VrankenWFL01,
  author    = {Harald P. E. Vranken and
               Tom Waayers and
               H{\'{e}}rv{\'{e}} Fleury and
               David Lelouvier},
  title     = {Enhanced reduced pin-count test for full-scan design},
  booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  pages     = {738--747},
  year      = {2001},
  crossref  = {DBLP:conf/itc/2001},
  url       = {https://doi.org/10.1109/TEST.2001.966695},
  doi       = {10.1109/TEST.2001.966695},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/VrankenWFL01.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2001,
  title     = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7640/proceeding},
  isbn      = {0-7803-7169-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/2001.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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