BibTeX record journals/tvlsi/SanyalGK12

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@article{DBLP:journals/tvlsi/SanyalGK12,
  author    = {Alodeep Sanyal and
               Kunal P. Ganeshpure and
               Sandip Kundu},
  title     = {Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering
               Gate Leakage Loading in Presence of Gate Delays},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {20},
  number    = {3},
  pages     = {424--436},
  year      = {2012},
  url       = {https://doi.org/10.1109/TVLSI.2011.2106169},
  doi       = {10.1109/TVLSI.2011.2106169},
  timestamp = {Thu, 18 May 2017 09:50:48 +0200},
  biburl    = {https://dblp.org/rec/journals/tvlsi/SanyalGK12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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