BibTeX record journals/tvlsi/KeaneVBK11

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@article{DBLP:journals/tvlsi/KeaneVBK11,
  author       = {John Keane and
                  Shrinivas Venkatraman and
                  Paulo F. Butzen and
                  Chris H. Kim},
  title        = {An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown
                  Characterization},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {19},
  number       = {5},
  pages        = {787--795},
  year         = {2011},
  url          = {https://doi.org/10.1109/TVLSI.2010.2041258},
  doi          = {10.1109/TVLSI.2010.2041258},
  timestamp    = {Thu, 14 Oct 2021 09:21:29 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/KeaneVBK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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