BibTeX record journals/tvlsi/CookSDST18

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@article{DBLP:journals/tvlsi/CookSDST18,
  author       = {Chase Cook and
                  Zeyu Sun and
                  Ertugrul Demircan and
                  Mehul D. Shroff and
                  Sheldon X.{-}D. Tan},
  title        = {Fast Electromigration Stress Evolution Analysis for Interconnect Trees
                  Using Krylov Subspace Method},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {26},
  number       = {5},
  pages        = {969--980},
  year         = {2018},
  url          = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2800707},
  doi          = {10.1109/TVLSI.2018.2800707},
  timestamp    = {Fri, 19 Feb 2021 15:10:08 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/CookSDST18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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