BibTeX record journals/tvlsi/BhowmikBDB18

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@article{DBLP:journals/tvlsi/BhowmikBDB18,
  author       = {Biswajit Bhowmik and
                  Santosh Biswas and
                  Jatindra Kumar Deka and
                  Bhargab B. Bhattacharya},
  title        = {Reliability-Aware Test Methodology for Detecting Short-Channel Faults
                  in On-Chip Networks},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {26},
  number       = {6},
  pages        = {1026--1039},
  year         = {2018},
  url          = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2803478},
  doi          = {10.1109/TVLSI.2018.2803478},
  timestamp    = {Wed, 11 Mar 2020 18:17:11 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/BhowmikBDB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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