BibTeX record journals/tr/TsaiSLCL16

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@article{DBLP:journals/tr/TsaiSLCL16,
  author       = {Tzong{-}Ru Tsai and
                  Wen{-}Yun Sung and
                  Yuhlong Lio and
                  Shing I. Chang and
                  Jye{-}Chyi Lu},
  title        = {Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation
                  Processes},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {65},
  number       = {1},
  pages        = {459--468},
  year         = {2016},
  url          = {https://doi.org/10.1109/TR.2015.2435774},
  doi          = {10.1109/TR.2015.2435774},
  timestamp    = {Thu, 09 Jul 2020 22:46:25 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/TsaiSLCL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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