BibTeX record journals/tr/ReiserFC96

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@article{DBLP:journals/tr/ReiserFC96,
  author       = {Benjamin Reiser and
                  Betty J. Flehinger and
                  Andrew R. Conn},
  title        = {Estimating component-defect probability from masked system success/failure
                  data},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {45},
  number       = {2},
  pages        = {238--243},
  year         = {1996},
  url          = {https://doi.org/10.1109/24.510808},
  doi          = {10.1109/24.510808},
  timestamp    = {Thu, 09 Jul 2020 22:46:44 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/ReiserFC96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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