BibTeX record journals/todaes/ShenTWX12

download as .bib file

@article{DBLP:journals/todaes/ShenTWX12,
  author       = {Ruijing Shen and
                  Sheldon X.{-}D. Tan and
                  Hai Wang and
                  Jinjun Xiong},
  title        = {Fast Statistical Full-Chip Leakage Analysis for Nanometer {VLSI} Systems},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {17},
  number       = {4},
  pages        = {51:1--51:19},
  year         = {2012},
  url          = {https://doi.org/10.1145/2348839.2348855},
  doi          = {10.1145/2348839.2348855},
  timestamp    = {Tue, 21 Mar 2023 21:13:55 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/ShenTWX12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.