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BibTeX record journals/tim/ScholzLTSSNHG09
@article{DBLP:journals/tim/ScholzLTSSNHG09, author = {Mirko Scholz and Dimitri Linten and Steven Thijs and Sandeep Sangameswaran and Masanori Sawada and Toshiyuki Nakaei and Takumi Hasebe and Guido Groeseneken}, title = {{ESD} On-Wafer Characterization: Is {TLP} Still the Right Measurement Tool?}, journal = {{IEEE} Trans. Instrum. Meas.}, volume = {58}, number = {10}, pages = {3418--3426}, year = {2009}, url = {https://doi.org/10.1109/TIM.2009.2017657}, doi = {10.1109/TIM.2009.2017657}, timestamp = {Mon, 08 Jun 2020 22:30:13 +0200}, biburl = {https://dblp.org/rec/journals/tim/ScholzLTSSNHG09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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