BibTeX record journals/tetc/BarenghiHBSRK14

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@article{DBLP:journals/tetc/BarenghiHBSRK14,
  author       = {Alessandro Barenghi and
                  C{\'{e}}dric Hocquet and
                  David Bol and
                  Fran{\c{c}}ois{-}Xavier Standaert and
                  Francesco Regazzoni and
                  Israel Koren},
  title        = {A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold
                  Devices to Low Voltage Fault Attacks},
  journal      = {{IEEE} Trans. Emerg. Top. Comput.},
  volume       = {2},
  number       = {2},
  pages        = {107--118},
  year         = {2014},
  url          = {https://doi.org/10.1109/TETC.2014.2316509},
  doi          = {10.1109/TETC.2014.2316509},
  timestamp    = {Thu, 14 Oct 2021 09:41:22 +0200},
  biburl       = {https://dblp.org/rec/journals/tetc/BarenghiHBSRK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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