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BibTeX record journals/technometrics/TianMMH17
@article{DBLP:journals/technometrics/TianMMH17, author = {Ye Tian and Ranjan Maitra and William Q. Meeker and Stephen D. Holland}, title = {A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images}, journal = {Technometrics}, volume = {59}, number = {2}, pages = {247--261}, year = {2017}, url = {https://doi.org/10.1080/00401706.2016.1153000}, doi = {10.1080/00401706.2016.1153000}, timestamp = {Wed, 14 Nov 2018 10:34:04 +0100}, biburl = {https://dblp.org/rec/journals/technometrics/TianMMH17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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