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BibTeX record journals/tcad/SunLLLG15
@article{DBLP:journals/tcad/SunLLLG15, author = {Shupeng Sun and Xin Li and Hongzhou Liu and Kangsheng Luo and Ben Gu}, title = {Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {34}, number = {7}, pages = {1096--1109}, year = {2015}, url = {https://doi.org/10.1109/TCAD.2015.2404895}, doi = {10.1109/TCAD.2015.2404895}, timestamp = {Thu, 24 Sep 2020 11:27:58 +0200}, biburl = {https://dblp.org/rec/journals/tcad/SunLLLG15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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