BibTeX record journals/tcad/HaznedarGZKOP06

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@article{DBLP:journals/tcad/HaznedarGZKOP06,
  author       = {Haldun Haznedar and
                  Martin Gall and
                  Vladimir Zolotov and
                  Pon Sung Ku and
                  Chanhee Oh and
                  Rajendran Panda},
  title        = {Impact of stress-induced backflow on full-chip electromigration risk
                  assessment},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {25},
  number       = {6},
  pages        = {1038--1046},
  year         = {2006},
  url          = {https://doi.org/10.1109/TCAD.2005.855941},
  doi          = {10.1109/TCAD.2005.855941},
  timestamp    = {Thu, 24 Sep 2020 11:28:09 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/HaznedarGZKOP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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