BibTeX record journals/tcad/ClementRCT99

download as .bib file

@article{DBLP:journals/tcad/ClementRCT99,
  author       = {J. Joseph Clement and
                  Stefan P. Riege and
                  Radenko Cvijetic and
                  Carl V. Thompson},
  title        = {Methodology for electromigration critical threshold design rule evaluation},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {18},
  number       = {5},
  pages        = {576--581},
  year         = {1999},
  url          = {https://doi.org/10.1109/43.759073},
  doi          = {10.1109/43.759073},
  timestamp    = {Thu, 24 Sep 2020 11:28:12 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/ClementRCT99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.