BibTeX record journals/tcad/Al-ArsG03

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@article{DBLP:journals/tcad/Al-ArsG03,
  author       = {Zaid Al{-}Ars and
                  Ad J. van de Goor},
  title        = {Test generation and optimization for {DRAM} cell defects using electrical
                  simulation},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {22},
  number       = {10},
  pages        = {1371--1384},
  year         = {2003},
  url          = {https://doi.org/10.1109/TCAD.2003.818125},
  doi          = {10.1109/TCAD.2003.818125},
  timestamp    = {Thu, 24 Sep 2020 11:27:54 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/Al-ArsG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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