BibTeX record journals/tcad/AbderrahmanCK99

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@article{DBLP:journals/tcad/AbderrahmanCK99,
  author       = {Abdessatar Abderrahman and
                  Eduard Cerny and
                  Bozena Kaminska},
  title        = {Worst case tolerance analysis and CLP-based multifrequency test generation
                  for analog circuits},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {18},
  number       = {3},
  pages        = {332--345},
  year         = {1999},
  url          = {https://doi.org/10.1109/43.748163},
  doi          = {10.1109/43.748163},
  timestamp    = {Thu, 24 Sep 2020 11:28:38 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/AbderrahmanCK99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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