BibTeX record journals/sigbed/BrostromZRY18

download as .bib file

@article{DBLP:journals/sigbed/BrostromZRY18,
  author       = {Tom Brostr{\"{o}}m and
                  John Zhu and
                  Ryan W. Robucci and
                  Mohamed F. Younis},
  title        = {IoT boot integrity measuring and reporting},
  journal      = {{SIGBED} Rev.},
  volume       = {15},
  number       = {5},
  pages        = {14--21},
  year         = {2018},
  url          = {https://doi.org/10.1145/3292384.3292387},
  doi          = {10.1145/3292384.3292387},
  timestamp    = {Sun, 10 Oct 2021 17:38:51 +0200},
  biburl       = {https://dblp.org/rec/journals/sigbed/BrostromZRY18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics