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BibTeX record journals/mva/ChouRSWB97
@article{DBLP:journals/mva/ChouRSWB97, author = {Paul B. Chou and A. Ravishankar Rao and Martin C. Sturzenbecker and Frederick Y. Wu and Virginia H. Brecher}, title = {Automatic defect classification for semiconductor manufacturing}, journal = {Mach. Vis. Appl.}, volume = {9}, number = {4}, pages = {201--214}, year = {1997}, url = {https://doi.org/10.1007/s001380050041}, doi = {10.1007/S001380050041}, timestamp = {Wed, 17 May 2017 14:25:42 +0200}, biburl = {https://dblp.org/rec/journals/mva/ChouRSWB97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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