BibTeX record journals/mr/ZhangHDZH11

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@article{DBLP:journals/mr/ZhangHDZH11,
  author       = {Shifeng Zhang and
                  Yan Han and
                  Koubao Ding and
                  Bin Zhang and
                  Jiaxian Hu},
  title        = {Investigation on hot-carrier-induced degradation of {SOI} {NLIGBT}},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {6},
  pages        = {1097--1104},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.02.009},
  doi          = {10.1016/J.MICROREL.2011.02.009},
  timestamp    = {Sat, 22 Feb 2020 19:26:43 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhangHDZH11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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