BibTeX record journals/mr/YehCGWL13

download as .bib file

@article{DBLP:journals/mr/YehCGWL13,
  author       = {Wen{-}Kuan Yeh and
                  Po{-}Ying Chen and
                  Kwang{-}Jow Gan and
                  Jer{-}Chyi Wang and
                  Chao{-}Sung Lai},
  title        = {The impact of interface/border defect on performance and reliability
                  of high-k/metal-gate {CMOSFET}},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {2},
  pages        = {265--269},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2012.07.036},
  doi          = {10.1016/J.MICROREL.2012.07.036},
  timestamp    = {Sat, 30 Sep 2023 10:21:36 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YehCGWL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.