BibTeX record journals/mr/WuHL03

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@article{DBLP:journals/mr/WuHL03,
  author       = {J. D. Wu and
                  C. Y. Huang and
                  C. C. Liao},
  title        = {Fracture strength characterization and failure analysis of silicon
                  dies},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {2},
  pages        = {269--277},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(02)00314-1},
  doi          = {10.1016/S0026-2714(02)00314-1},
  timestamp    = {Sat, 22 Feb 2020 19:27:39 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WuHL03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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