BibTeX record journals/mr/WrachienCLMDSTM14

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@article{DBLP:journals/mr/WrachienCLMDSTM14,
  author    = {Nicola Wrachien and
               Andrea Cester and
               N. Lago and
               Gaudenzio Meneghesso and
               Riccardo D'Alpaos and
               Andrea Stefani and
               Guido Turatti and
               Michele Muccini},
  title     = {Stress-induced degradation of p- and n-type organic thin-film-transistors
               in the {ON} and {OFF} states},
  journal   = {Microelectronics Reliability},
  volume    = {54},
  number    = {9-10},
  pages     = {1638--1642},
  year      = {2014},
  url       = {https://doi.org/10.1016/j.microrel.2014.07.065},
  doi       = {10.1016/j.microrel.2014.07.065},
  timestamp = {Fri, 30 Nov 2018 13:28:44 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/WrachienCLMDSTM14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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