BibTeX record journals/mr/WrachienCBCDMSTM13

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@article{DBLP:journals/mr/WrachienCBCDMSTM13,
  author    = {Nicola Wrachien and
               Andrea Cester and
               D. Bari and
               Raffaella Capelli and
               Riccardo D'Alpaos and
               Michele Muccini and
               Andrea Stefani and
               Guido Turatti and
               Gaudenzio Meneghesso},
  title     = {Effects of constant voltage stress on p- and n-type organic thin film
               transistors with poly(methyl methacrylate) gate dielectric},
  journal   = {Microelectronics Reliability},
  volume    = {53},
  number    = {9-11},
  pages     = {1798--1803},
  year      = {2013},
  url       = {https://doi.org/10.1016/j.microrel.2013.07.085},
  doi       = {10.1016/j.microrel.2013.07.085},
  timestamp = {Thu, 08 Jun 2017 09:07:18 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/WrachienCBCDMSTM13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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