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BibTeX record journals/mr/WatanabeTKSO07
@article{DBLP:journals/mr/WatanabeTKSO07, author = {Kazufumi Watanabe and Akinobu Teramoto and Rihito Kuroda and Shigetoshi Sugawa and Tadahiro Ohmi}, title = {Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {409--418}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.001}, doi = {10.1016/J.MICROREL.2006.06.001}, timestamp = {Mon, 26 Oct 2020 08:59:29 +0100}, biburl = {https://dblp.org/rec/journals/mr/WatanabeTKSO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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