BibTeX record journals/mr/VargheseRKA14

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@article{DBLP:journals/mr/VargheseRKA14,
  author    = {D. Varghese and
               V. Reddy and
               S. Krishnan and
               Muhammad Ashraful Alam},
  title     = {OFF-state degradation and correlated gate dielectric breakdown in
               high voltage drain extended transistors: {A} review},
  journal   = {Microelectron. Reliab.},
  volume    = {54},
  number    = {8},
  pages     = {1477--1488},
  year      = {2014},
  url       = {https://doi.org/10.1016/j.microrel.2014.03.013},
  doi       = {10.1016/j.microrel.2014.03.013},
  timestamp = {Sat, 22 Feb 2020 19:27:02 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/VargheseRKA14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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