BibTeX record journals/mr/TyaginovSTCJCPEKKSMCG10

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@article{DBLP:journals/mr/TyaginovSTCJCPEKKSMCG10,
  author       = {Stanislav Tyaginov and
                  Ivan A. Starkov and
                  Oliver Triebl and
                  Johann Cervenka and
                  C. Jungemann and
                  Sara Carniello and
                  Jong Mun Park and
                  Hubert Enichlmair and
                  Markus Karner and
                  Ch. Kernstock and
                  Ehrenfried Seebacher and
                  Rainer Minixhofer and
                  Hajdin Ceric and
                  Tibor Grasser},
  title        = {Interface traps density-of-states as a vital component for hot-carrier
                  degradation modeling},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1267--1272},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.030},
  doi          = {10.1016/J.MICROREL.2010.07.030},
  timestamp    = {Sat, 30 Sep 2023 10:21:35 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TyaginovSTCJCPEKKSMCG10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}